Invention Grant
- Patent Title: Apparatus state determination method and system
- Patent Title (中): 仪器状态确定方法和系统
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Application No.: US11644158Application Date: 2006-12-22
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Publication No.: US07901131B2Publication Date: 2011-03-08
- Inventor: Cullen E. Bash , Ratnesh Sharma
- Applicant: Cullen E. Bash , Ratnesh Sharma
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01N25/20
- IPC: G01N25/20 ; G01R31/00
Abstract:
In a method for determining a state of an apparatus, detected temperatures are received from a plurality of sensors and are compared to at least one preset condition. The state of the apparatus is determined based upon the comparison.
Public/Granted literature
- US20080154534A1 Apparatus state determination method and system Public/Granted day:2008-06-26
Information query
