Invention Grant
US07901992B2 Die bonding agent and a semiconductor device made by using the same
有权
芯片粘合剂和使用该半导体器件的半导体器件
- Patent Title: Die bonding agent and a semiconductor device made by using the same
- Patent Title (中): 芯片粘合剂和使用该半导体器件的半导体器件
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Application No.: US12081992Application Date: 2008-04-24
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Publication No.: US07901992B2Publication Date: 2011-03-08
- Inventor: Tsuyoshi Honda , Tatsuya Kanemaru
- Applicant: Tsuyoshi Honda , Tatsuya Kanemaru
- Applicant Address: JP Tokyo
- Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2007-117126 20070426
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A die bonding agent comprising (A) an epoxy resin, (B) a curing agent, and (C) an inorganic filler, the die bonding agent having a viscosity ratio, V1/V2, ranging (i) from 1.5 to 4 at a temperature of from room temperature to 50° C., and (ii) from 0.5 to less than 1.5 at a temperature at which the die bonding agent hardens in 0.5 hour to 1.5 hours, the viscosities being measured in 10 minutes after the die bonding agent is placed on a sample stage of a Brook Field viscometer, wherein V1 is a viscosity measured by stirring 0.5 ml of the die bonding agent with a No. 51 spindle at 0.5 rpm and V2 is a viscosity measured by stirring 0.5 ml of the die bonding agent with a No. 51 spindle at 5 rpm in the Brook Field viscometer.
Public/Granted literature
- US20080265439A1 Die bonding agent and a semiconductor device made by using the same Public/Granted day:2008-10-30
Information query
IPC分类: