Invention Grant
- Patent Title: Method of manufacturing a dual metal Schottky diode
- Patent Title (中): 制造双金属肖特基二极管的方法
-
Application No.: US11095245Application Date: 2005-03-30
-
Publication No.: US07902055B2Publication Date: 2011-03-08
- Inventor: Richard B. Irwin , Tony T. Phan , Hong-Ryong Kim , Ming-Yeh Chuang , Jennifer S. Dumin , Patrick J. Jones , Fredric D. Bailey
- Applicant: Richard B. Irwin , Tony T. Phan , Hong-Ryong Kim , Ming-Yeh Chuang , Jennifer S. Dumin , Patrick J. Jones , Fredric D. Bailey
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incoprorated
- Current Assignee: Texas Instruments Incoprorated
- Current Assignee Address: US TX Dallas
- Agent Rose Alyssa Keagy; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L29/872
- IPC: H01L29/872 ; H01L29/47

Abstract:
An embodiment of the invention is a Schottky diode 22 having a semiconductor substrate 3, a first metal 24, a barrier layer 26, and second metal 28. Another embodiment of the invention is a method of manufacturing a Schottky diode 22 that includes providing a semiconductor substrate 3, forming a barrier layer 26 over the semiconductor substrate 3, forming a first metal layer 23 over the semiconductor substrate 3, annealing the semiconductor substrate 3 to form areas 24 of reacted first metal and areas 23 of un-reacted first metal, and removing selected areas 23 of the un-reacted first metal. The method further includes forming a second metal layer 30 over the semiconductor substrate 3 and annealing the semiconductor substrate 3 to form areas 28 of reacted second metal and areas 30 of un-reacted second metal.
Public/Granted literature
- US20050218433A1 Dual metal schottky diode Public/Granted day:2005-10-06
Information query
IPC分类: