Invention Grant
US07902081B2 Methods of etching polysilicon and methods of forming pluralities of capacitors
有权
蚀刻多晶硅的方法和形成多个电容器的方法
- Patent Title: Methods of etching polysilicon and methods of forming pluralities of capacitors
- Patent Title (中): 蚀刻多晶硅的方法和形成多个电容器的方法
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Application No.: US11580418Application Date: 2006-10-11
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Publication No.: US07902081B2Publication Date: 2011-03-08
- Inventor: Prashant Raghu , Vishwanath Bhat , Niraj Rana
- Applicant: Prashant Raghu , Vishwanath Bhat , Niraj Rana
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A method of etching polysilicon includes exposing a substrate comprising polysilicon to a solution comprising water, HF, and at least one of a conductive metal nitride, Pt, and Au under conditions effective to etch polysilicon from the substrate. In one embodiment, a substrate first region comprising polysilicon and a substrate second region comprising at least one of a conductive metal nitride, Pt, and Au is exposed to a solution comprising water and HF. The solution is devoid of any detectable conductive metal nitride, Pt, and Au prior to the exposing. At least some of the at least one are etched into the solution upon the exposing. Then, polysilicon is etched from the first region at a faster rate than any etch rate of the first region polysilicon prior to the etching of the at least some of the conductive metal nitride, Pt, and Au.
Public/Granted literature
- US20080090416A1 Methods of etching polysilicon and methods of forming pluralities of capacitors Public/Granted day:2008-04-17
Information query
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