Invention Grant
US07902084B2 Silicon dioxide deposition methods using at least ozone and TEOS as deposition precursors
有权
至少使用臭氧和TEOS作为沉积前体的二氧化硅沉积方法
- Patent Title: Silicon dioxide deposition methods using at least ozone and TEOS as deposition precursors
- Patent Title (中): 至少使用臭氧和TEOS作为沉积前体的二氧化硅沉积方法
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Application No.: US11773622Application Date: 2007-07-05
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Publication No.: US07902084B2Publication Date: 2011-03-08
- Inventor: John Smythe , Gurtej S. Sandhu
- Applicant: John Smythe , Gurtej S. Sandhu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L21/31
- IPC: H01L21/31

Abstract:
Embodiments disclosed herein pertain to silicon dioxide deposition methods using at least ozone and tetraethylorthosilicate (TEOS) as deposition precursors. In one embodiment, a silicon dioxide deposition method using at least ozone and TEOS as deposition precursors includes flowing precursors comprising ozone and TEOS to a substrate under subatmospheric pressure conditions effective to deposit silicon dioxide-comprising material having an outer surface onto the substrate. The outer surface is treated effective to one of add hydroxyl to or remove hydroxyl from the outer surface in comparison to any hydroxyl presence on the outer surface prior to said treating. After the treating, precursors comprising ozone and TEOS are flowed to the substrate under subatmospheric pressure conditions effective to deposit silicon dioxide-comprising material onto the treated outer surface of the substrate. Other embodiments are contemplated.
Public/Granted literature
- US20090011607A1 Silicon Dioxide Deposition Methods Using at Least Ozone and TEOS as Deposition Precursors Public/Granted day:2009-01-08
Information query
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