Invention Grant
- Patent Title: Gated nanorod field emitter structures and associated methods of fabrication
- Patent Title (中): 门极纳米棒场发射极结构及相关制造方法
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Application No.: US11971452Application Date: 2008-01-09
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Publication No.: US07902736B2Publication Date: 2011-03-08
- Inventor: Heather Diane Hudspeth , Ji Ung Lee , Reed Roeder Corderman , Anping Zhang , Renee Bushey Rohling , Lauraine Denault , Joleyn Eileen Balch
- Applicant: Heather Diane Hudspeth , Ji Ung Lee , Reed Roeder Corderman , Anping Zhang , Renee Bushey Rohling , Lauraine Denault , Joleyn Eileen Balch
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Paul J. DiConza
- Main IPC: H01J1/62
- IPC: H01J1/62

Abstract:
The present invention relates to gated nanorod field emission devices, wherein such devices have relatively small emitter tip-to-gate distances, thereby providing a relatively high emitter tip density and low turn on voltage. Such methods employ a combination of traditional device processing techniques (lithography, etching, etc.) with electrochemical deposition of nanorods. These methods are relatively simple, cost-effective, and efficient; and they provide field emission devices that are suitable for use in x-ray imaging applications, lighting applications, flat panel field emission display (FED) applications, etc.
Public/Granted literature
- US20080129178A1 GATED NANOROD FIELD EMITTER STRUCTURES AND ASSOCIATED METHODS OF FABRICATION Public/Granted day:2008-06-05
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