Invention Grant
- Patent Title: Malfunction detecting circuit and malfunction detecting method for detecting malfunction of current-sensing resistor, and power converting system applying the malfunction detecting circuit
- Patent Title (中): 用于检测电流检测电阻器的故障的故障检测电路和故障检测方法以及应用故障检测电路的电力转换系统
-
Application No.: US12260076Application Date: 2008-10-28
-
Publication No.: US07902833B2Publication Date: 2011-03-08
- Inventor: Chun-Liang Lin
- Applicant: Chun-Liang Lin
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Leadtrend Technology Corp.
- Current Assignee: Leadtrend Technology Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: TW97106610A 20080226
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A malfunction detecting circuit for detecting malfunction of a current sensing resistor includes a reference-voltage generating circuit and a comparing circuit, wherein the reference-voltage generating circuit is utilized to generate a reference voltage signal varying with the on time period of a power switch of a power converting system. The comparing circuit compares a sensing voltage signal corresponding to a current flowing through the current sensing resistor with the reference voltage signal to generate a comparing result indicating whether the malfunction occurs.
Public/Granted literature
Information query
