Invention Grant
- Patent Title: Semiconductor device and test method thereof
- Patent Title (中): 半导体器件及其测试方法
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Application No.: US12482560Application Date: 2009-06-11
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Publication No.: US07902847B2Publication Date: 2011-03-08
- Inventor: Jun-Hyun Chun
- Applicant: Jun-Hyun Chun
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2006-0083532 20060831
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A semiconductor device includes: a command control circuit for decoding a command signal to output a test signal and a normal control signal; a normal circuit for performing a predetermined operation in response to the normal control signal; and a test circuit for testing electrical characteristics of unit elements provided in the normal circuit in response to the test signal.
Public/Granted literature
- US20090267633A1 SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF Public/Granted day:2009-10-29
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