Invention Grant
- Patent Title: Hermeticity testing
- Patent Title (中): 密码测试
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Application No.: US12569474Application Date: 2009-09-29
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Publication No.: US07902851B2Publication Date: 2011-03-08
- Inventor: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
- Applicant: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agent Carol F. Barry
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/26
Abstract:
Electrical circuit apparatus and methods including hermeticity testing structures for testing the hermeticity of the electrical circuit apparatus.
Public/Granted literature
- US20100315110A1 HERMETICITY TESTING Public/Granted day:2010-12-16
Information query
