Invention Grant
- Patent Title: Demodulation apparatus, test apparatus and electronic device
- Patent Title (中): 解调装置,试验装置和电子装置
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Application No.: US12557440Application Date: 2009-09-10
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Publication No.: US07902918B2Publication Date: 2011-03-08
- Inventor: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Priority: JP2007-089692 20070329
- Main IPC: H03D1/00
- IPC: H03D1/00 ; H03D3/02 ; G01R25/00

Abstract:
A demodulation apparatus that demodulates an amplitude-phase-modulated signal having a level and a transition phase selected from among a plurality of levels and a plurality of phases according to transmission data, comprising a clock recovering section that receives the amplitude-phase-modulated signal and recovers a clock signal synchronized with the amplitude-phase-modulated signal; an amplitude and phase detecting section that detects, with the clock signal as a reference, the level and the transition phase of the amplitude-phase-modulated signal; a data output section that outputs data corresponding to the level and the transition phase detected by the amplitude and phase detecting section; and a phase difference correcting section that outputs a correction signal for correcting an oscillation frequency of the clock signal output by the clock recovering section, according to the transition phase detected by the amplitude and phase detecting section.
Public/Granted literature
- US20100066443A1 DEMODULATION APPARATUS, TEST APPARATUS AND ELECTRONIC DEVICE Public/Granted day:2010-03-18
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