Invention Grant
- Patent Title: Surveying instrument and surveying method
- Patent Title (中): 测量仪器和测量方法
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Application No.: US11992517Application Date: 2006-08-10
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Publication No.: US07903235B2Publication Date: 2011-03-08
- Inventor: Masahiro Ohishi , Isao Minegishi
- Applicant: Masahiro Ohishi , Isao Minegishi
- Applicant Address: JP Tokyo
- Assignee: Topcon Corporation
- Current Assignee: Topcon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2005-278905 20050926
- International Application: PCT/JP2006/315845 WO 20060810
- International Announcement: WO2007/034635 WO 20070329
- Main IPC: G01C3/08
- IPC: G01C3/08

Abstract:
A surveying instrument and a surveying method for further minimizing a measurement error when the surveying instrument casts a light to a measuring object and receives the reflected light and measures a delay time or a distance. A reference pulse light r and a measurement pulse light o1 are received as a received light signal by a light receiving section 9, and a damping signal S3U is formed from the received light signals r, o1, and an amplification rate of a minute level signal in the proximity of a zero cross point Q0 of the damping signal S3U is greatly amplified, and timing signals r′, o1′ are formed by using an amplified signal. Therefore, the measurement error can be minimized.
Public/Granted literature
- US20090268193A1 Surveying Instrument and Surveying Method Public/Granted day:2009-10-29
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