Invention Grant
US07903844B2 Failure analysis system, failure analysis method, and program product for failure analysis
有权
故障分析系统,故障分析方法和故障分析程序产品
- Patent Title: Failure analysis system, failure analysis method, and program product for failure analysis
- Patent Title (中): 故障分析系统,故障分析方法和故障分析程序产品
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Application No.: US11652531Application Date: 2007-01-12
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Publication No.: US07903844B2Publication Date: 2011-03-08
- Inventor: Tetsuichi Satonaga , Koki Uwatoko , Koji Adachi , Kaoru Yasukawa
- Applicant: Tetsuichi Satonaga , Koki Uwatoko , Koji Adachi , Kaoru Yasukawa
- Applicant Address: JP Tokyo
- Assignee: Fuji Xerox Co., Ltd.
- Current Assignee: Fuji Xerox Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-106765 20060407
- Main IPC: G06K9/03
- IPC: G06K9/03

Abstract:
A failure analysis system includes an obtaining portion that obtains read-in image information that is image information obtained by reading an output image, a memory that stores fundamental image reduction information that is information in which an information amount of fundamental image information is reduced, the fundamental image information serving as a fundamental of the output image, a calculating portion that calculates a characteristic value of a projecting waveform by use of differential information between read-in image reduction information and the fundamental image reduction information, the read-in image reduction information being information in which the information amount of the read-in image information obtained by the obtaining portion is reduced, the fundamental image reduction information being stored in the memory; and a determining portion that determines a defect type group that is a group of defect types of elements included in the output image by use of a clustering process.
Public/Granted literature
- US20070237399A1 Failure analysis system, failure analysis method, and program product for failure analysis Public/Granted day:2007-10-11
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