Invention Grant
- Patent Title: Method for detecting geometrical structures in images
- Patent Title (中): 检测图像几何结构的方法
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Application No.: US11631991Application Date: 2005-07-08
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Publication No.: US07903862B2Publication Date: 2011-03-08
- Inventor: Achim Kirsch , Fritz Jetzek
- Applicant: Achim Kirsch , Fritz Jetzek
- Applicant Address: DE
- Assignee: Evotec Technologies GmbH
- Current Assignee: Evotec Technologies GmbH
- Current Assignee Address: DE
- Agency: Ohlandt, Greeley, Ruggiero & Perle, LLP
- Priority: EP04016307 20040710
- International Application: PCT/EP2005/053275 WO 20050708
- International Announcement: WO2006/005728 WO 20060119
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/48

Abstract:
A method for detecting geometrical structures in images, especially in images of chemical and/or biological samples, such as images of cells, the method comprising the following steps: detecting a boundary line of the image object; defining at least one sector inside the image, the origin (pk) of which lies on the boundary line; transforming the image section defined by the sector into a transformation space by means of a transformation that associates signatures in the transformation space with respective geometrical structures in the image section; determining the presence of at least one signature inside the transformation space; and retransforming the signatures from the transformation space into the sector for the representation of the geometrical structure.
Public/Granted literature
- US20070263917A1 Method for Detecting Geometrical Structures in Images Public/Granted day:2007-11-15
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