Invention Grant
- Patent Title: Automatic optical inspection system and method
- Patent Title (中): 自动光学检测系统及方法
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Application No.: US11727568Application Date: 2007-03-27
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Publication No.: US07903865B2Publication Date: 2011-03-08
- Inventor: Wei-Chen Li , Yih-Chih Chiou
- Applicant: Wei-Chen Li , Yih-Chih Chiou
- Applicant Address: TW Hsinchu
- Assignee: Chuang Hwa University
- Current Assignee: Chuang Hwa University
- Current Assignee Address: TW Hsinchu
- Agency: Rosenberg, Klein & Lee
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/68

Abstract:
An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method.
Public/Granted literature
- US20080240541A1 Automatic optical inspection system and method Public/Granted day:2008-10-02
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