Invention Grant
- Patent Title: Dependent temperature control within disk drive testing systems
- Patent Title (中): 磁盘驱动器测试系统中的相关温度控制
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Application No.: US12727207Application Date: 2010-03-18
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Publication No.: US07904211B2Publication Date: 2011-03-08
- Inventor: Brian S. Merrow , Eric L. Truebenbach , Marc Lesueur Smith
- Applicant: Brian S. Merrow , Eric L. Truebenbach , Marc Lesueur Smith
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: G05D23/00
- IPC: G05D23/00
Abstract:
A method of controlling a temperature of a test slot in a disk drive testing system includes regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.
Public/Granted literature
- US20100165498A1 Dependent Temperature Control Within Disk Drive Testing Systems Public/Granted day:2010-07-01
Information query
