Invention Grant
- Patent Title: Absolute duty cycle measurement
- Patent Title (中): 绝对占空比测量
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Application No.: US11938456Application Date: 2007-11-12
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Publication No.: US07904264B2Publication Date: 2011-03-08
- Inventor: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- Applicant: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Stephen R. Tkacs; Stephen J. Walder, Jr.; Matthew B. Talpis
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R15/00

Abstract:
A mechanism for measuring the absolute duty cycle of a signal is provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values.
Public/Granted literature
- US20090125262A1 Absolute Duty Cycle Measurement Method and Apparatus Public/Granted day:2009-05-14
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