Invention Grant
- Patent Title: Circuits and methods for calibrating a delay element
- Patent Title (中): 用于校准延迟元件的电路和方法
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Application No.: US12052403Application Date: 2008-03-20
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Publication No.: US07904265B2Publication Date: 2011-03-08
- Inventor: Alexander Tesler
- Applicant: Alexander Tesler
- Applicant Address: SG Singapore
- Assignee: Avago Technologies Fiber IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies Fiber IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G01R29/02
- IPC: G01R29/02 ; G01R19/00

Abstract:
A controllable delay element is coupled in parallel with a calibration circuit. The calibration circuit receives a periodic reference signal and generates a series of sample voltages responsive to a time-varying analog voltage, the periodic reference signal, and the delayed periodic signal at the output of the controllable delay element. The calibration circuit distributes the series of sampled voltages for determining the components of a first vector. The first vector components are used to calculate the phase that results from a control signal applied to the controllable delay element. After the control signal is modified, a second vector is used to calculate the phase that results from the control signal. The delay can be determined by the product of the period of the reference signal and the difference in phase.
Public/Granted literature
- US20090240456A1 Circuits and Methods for Calibrating a Delay Element Public/Granted day:2009-09-24
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