Invention Grant
- Patent Title: System and method for calculating coordinate values of a measuring machine
- Patent Title (中): 用于计算测量机坐标值的系统和方法
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Application No.: US12176424Application Date: 2008-07-21
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Publication No.: US07904272B2Publication Date: 2011-03-08
- Inventor: Chih-Kuang Chang , Wei-Qi Sun
- Applicant: Chih-Kuang Chang , Wei-Qi Sun
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200710202814 20071130
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
A method for calculating coordinate values of a measuring machine is provided. The method includes receiving signals in three dimensions from a raster ruler signal generator, identifying a direction of each signal and multiply a frequency of each signal. The method further includes counting each of multiplied signals in each dimension, sending the counted data to the MCU. The method further includes adding the counted data of each of the multiplied signals in each dimension to obtain an accumulated number in each dimension and calculating coordinate values of the measuring machine according to the accumulated number in each dimension and a proportionality factor of the raster ruler signal generator.
Public/Granted literature
- US20090144018A1 SYSTEM AND METHOD FOR CALCULATING COORDINATE VALUES OF A MEASURING MACHINE Public/Granted day:2009-06-04
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