Invention Grant
- Patent Title: Methods and apparatus for data analysis
- Patent Title (中): 数据分析方法和装置
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Application No.: US11857654Application Date: 2007-09-19
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Publication No.: US07904279B2Publication Date: 2011-03-08
- Inventor: Emilio Miguelanez , Michael J. Scott , Greg LaBonte
- Applicant: Emilio Miguelanez , Michael J. Scott , Greg LaBonte
- Applicant Address: US AZ Tempe
- Assignee: Test Advantage, Inc.
- Current Assignee: Test Advantage, Inc.
- Current Assignee Address: US AZ Tempe
- Agency: The Noblitt Group, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
Public/Granted literature
- US20080091977A1 METHODS AND APPARATUS FOR DATA ANALYSIS Public/Granted day:2008-04-17
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