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US07904279B2 Methods and apparatus for data analysis 有权
数据分析方法和装置

Methods and apparatus for data analysis
Abstract:
Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
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