Invention Grant
- Patent Title: Method and system for testing functionality of a chip checker
- Patent Title (中): 用于测试芯片检查器功能的方法和系统
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Application No.: US11938532Application Date: 2007-11-12
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Publication No.: US07904289B2Publication Date: 2011-03-08
- Inventor: Shridhar Narasimha Ambilkar , Girish Gopala Kurup
- Applicant: Shridhar Narasimha Ambilkar , Girish Gopala Kurup
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Sprusons and Ferguson
- Agent Roy W. Truelson
- Main IPC: G06F9/455
- IPC: G06F9/455

Abstract:
A method for testing functionality of a chip checker is disclosed. The checker is arranged for generating a predetermined verification signal when the chip, upon receiving a predetermined input signal, generates a corresponding response signal. The method comprises the steps of developing a model of the chip, the model at least partially emulating at least one response of the chip by generating, upon receiving the predetermined input signal, the corresponding response signal. The method further supplies the developed chip model with the predetermined input signal. The checker is then used to test whether the generated response signal corresponds to the respective predetermined input signal. A failure of the checker to generate the predetermined verification signal indicates checker malfunction.
Public/Granted literature
- US20090125292A1 METHOD AND SYSTEM FOR TESTING FUNCTIONALITY OF A CHIP CHECKER Public/Granted day:2009-05-14
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