Invention Grant
- Patent Title: Self-diagnostic circuit and self-diagnostic method for detecting errors
- Patent Title (中): 自诊断电路和自诊断方法检测误差
-
Application No.: US12292862Application Date: 2008-11-26
-
Publication No.: US07904771B2Publication Date: 2011-03-08
- Inventor: Hideo Mochizuki
- Applicant: Hideo Mochizuki
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2007-305396 20071127
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A self-diagnostic circuit includes a setting unit receiving a plurality of detection signals generated in an integrated circuit device, and determining a type of detection signal to be detected among the received plurality of detection signals. A counter is coupled to the setting unit and counts a number of a signal corresponding to the type of the detection signal to be detected.
Public/Granted literature
- US20090138767A1 Self-diagnostic circuit and self-diagnostic method for detecting errors Public/Granted day:2009-05-28
Information query
