Invention Grant
US07904776B2 Jitter injection circuit, pattern generator, test apparatus, and electronic device
有权
抖动注入电路,图案发生器,测试仪器和电子设备
- Patent Title: Jitter injection circuit, pattern generator, test apparatus, and electronic device
- Patent Title (中): 抖动注入电路,图案发生器,测试仪器和电子设备
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Application No.: US12022163Application Date: 2008-01-30
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Publication No.: US07904776B2Publication Date: 2011-03-08
- Inventor: Kiyotaka Ichiyama , Masahiro Ishida
- Applicant: Kiyotaka Ichiyama , Masahiro Ishida
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Liang LLP
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/40

Abstract:
Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that are connected in a cascading manner and that each sequentially delay a supplied reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.
Public/Granted literature
- US20090189667A1 JITTER INJECTION CIRCUIT, PATTERN GENERATOR, TEST APPARATUS, AND ELECTRONIC DEVICE Public/Granted day:2009-07-30
Information query
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