Invention Grant
US07904844B2 System, method, and computer program product for matching cell layout of an integrated circuit design
有权
用于匹配集成电路设计的单元布局的系统，方法和计算机程序产品
- Patent Title: System, method, and computer program product for matching cell layout of an integrated circuit design
- Patent Title (中): 用于匹配集成电路设计的单元布局的系统，方法和计算机程序产品
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Application No.: US11949311Application Date: 2007-12-03
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Publication No.: US07904844B2Publication Date: 2011-03-08
- Inventor: Gwan Sin Chang , Cheng-Hung Yeh , Feng-Ming Chang , Ping-Wei Wang
- Applicant: Gwan Sin Chang , Cheng-Hung Yeh , Feng-Ming Chang , Ping-Wei Wang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
An automated system for checking an integrated circuit cell layout includes searching the cell layout for a sub-area containing a predefined identifier, determining a reference cell layout corresponding to the predefined identifier, verifying the cell layout by comparing the cell layout to the reference cell layout to determine if a cell is of concern, and reporting the cell of concern to a user.
Public/Granted literature
- US20080244482A1 INTEGRATED CIRCUIT DESIGN USAGE AND SANITY VERIFICATION Public/Granted day:2008-10-02
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