Invention Grant
- Patent Title: Method and apparatus for probe tip diameter calibration
- Patent Title (中): 探针尖端直径校准的方法和装置
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Application No.: US12496469Application Date: 2009-07-01
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Publication No.: US07905027B2Publication Date: 2011-03-15
- Inventor: Richard MacManus
- Applicant: Richard MacManus
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01B21/00
- IPC: G01B21/00
Abstract:
A method for determining probe tip diameters with improved accuracy and reliability that includes performing a routine for determining probe tip diameter multiple times with the arm of the coordinate measurement machine in different machine positions. Diameter values associated with each of the calibration routines may be combined in a manner that provides more accurate diameter measurements.
Public/Granted literature
- US20110000277A1 METHOD AND APPARATUS FOR PROBE TIP DIAMETER CALIBRATION Public/Granted day:2011-01-06
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