Invention Grant
- Patent Title: Localized plasmon resonance sensor and examining device
- Patent Title (中): 局部等离子体共振传感器和检查装置
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Application No.: US10594698Application Date: 2005-03-30
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Publication No.: US07906344B2Publication Date: 2011-03-15
- Inventor: Tomohiko Matsushita , Shigeru Aoyama , Takeo Nishikawa , Shingo Nagaoka , Tetsuichi Wazawa
- Applicant: Tomohiko Matsushita , Shigeru Aoyama , Takeo Nishikawa , Shingo Nagaoka , Tetsuichi Wazawa
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Osha • Liang LLP
- Priority: JP2004-102017 20040331
- International Application: PCT/JP2005/006116 WO 20050330
- International Announcement: WO2005/095927 WO 20051013
- Main IPC: G01N33/553
- IPC: G01N33/553

Abstract:
The metal fine particles 33 are sparsely fixed on the surface of the transparent substrate 32, and the acceptor 35 for attaching the specific ligand is immobilized on the transparent substrate 32 or the metal fine particles 33. The prism 36 is closely attached to the lower surface of the transparent substrate 32, and the excitation light enters the transparent substrate 32 through the prism 36. The incident light is totally reflected at the surface of the transparent substrate 32, and the evanescent light generated at the surface and the metal fine particles 33 locally plasmon resonate. As the evanescent light and the metal fine particles locally plasmon resonate, a strong electric field is enclosed in the vicinity of the metal fine particles. When the surface arranged with the metal fine particles 33 and the acceptor 35 is contacted to the analysis sample solution containing ligand modified with light emitting molecules, only the light emitting molecule modifying a specific ligand attached to the acceptor emits light.
Public/Granted literature
- US20070273884A1 Localized Plasmon Resonance Sensor and Examining Device Public/Granted day:2007-11-29
Information query
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