Invention Grant
- Patent Title: Compensation techniques for substrate heating processes
- Patent Title (中): 基板加热工艺的补偿技术
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Application No.: US12573139Application Date: 2009-10-04
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Publication No.: US07906402B2Publication Date: 2011-03-15
- Inventor: Joseph M. Ranish , Bruce E. Adams
- Applicant: Joseph M. Ranish , Bruce E. Adams
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser IP Law Group
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L21/331 ; H01L21/00

Abstract:
Methods for compensating for a thermal profile in a substrate heating process are provided herein. In some embodiments, a method of processing a substrate includes determining an initial thermal profile of a substrate that would result from subjecting the substrate to a process; determining a compensatory thermal profile based upon the initial thermal profile and a desired thermal profile; imposing the compensatory thermal profile on the substrate prior to performing the process on the substrate; and performing the process to create the desired thermal profile on the substrate. The initial substrate thermal profile can also be compensated for by adjusting a local mass heated per unit area, a local heat capacity per unit area, or an absorptivity or reflectivity of a component proximate the substrate prior to performing the process. Heat provided by an edge ring to the substrate may be controlled prior to or during the substrate heating process.
Public/Granted literature
- US20100023154A1 COMPENSATION TECHNIQUES FOR SUBSTRATE HEATING PROCESSES Public/Granted day:2010-01-28
Information query
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