Invention Grant
- Patent Title: Method for manufacturing semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US11871525Application Date: 2007-10-12
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Publication No.: US07906416B2Publication Date: 2011-03-15
- Inventor: Masanobu Tsuchitani , Hideki Nozaki , Motoshige Kobayashi
- Applicant: Masanobu Tsuchitani , Hideki Nozaki , Motoshige Kobayashi
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-280787 20061013
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method for manufacturing a semiconductor device from a semiconductor wafer having a first major surface, a recess provided inside a periphery on opposite side of the first major surface and surrounded by the periphery, and a second major surface provided at bottom of the recess is provided. The method comprises: fitting into the recess a doping mask having selectively formed openings to selectively cover the second major surface with the doping mask; and selectively introducing dopant into the second major surface.
Public/Granted literature
- US20080090391A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2008-04-17
Information query
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