Invention Grant
- Patent Title: Inspection method and reagent solution
- Patent Title (中): 检验方法和试剂溶液
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Application No.: US12335143Application Date: 2008-12-15
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Publication No.: US07906760B2Publication Date: 2011-03-15
- Inventor: Hidetoshi Nishiyama , Mitsuo Suga , Mitsuru Koizumi
- Applicant: Hidetoshi Nishiyama , Mitsuo Suga , Mitsuru Koizumi
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2008-099856 20080408
- Main IPC: H01J37/20
- IPC: H01J37/20

Abstract:
An electron microscope method for inspecting a liquid specimen and a reagent solution therefor. A culture medium and biological cells are put in the sample holder. A plugging agent is mixed into the liquid sample. The cells can be irradiated with a primary beam via a film. An image of the cells or information about the cells is obtained by detecting a resulting secondary signal. If the film is destroyed, the plugging agent plugs up the damaged portion of the film. Consequently, liquid leakage can be minimized.
Public/Granted literature
- US20090250609A1 Inspection Method and Reagent Solution Public/Granted day:2009-10-08
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