Invention Grant
- Patent Title: Dual output stage source measure circuit
- Patent Title (中): 双输出级源测量电路
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Application No.: US12053878Application Date: 2008-03-24
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Publication No.: US07906977B1Publication Date: 2011-03-15
- Inventor: Wayne C. Goeke , Martin J. Rice
- Applicant: Wayne C. Goeke , Martin J. Rice
- Applicant Address: US OH Cleveland
- Assignee: Keithley Instruments, Inc.
- Current Assignee: Keithley Instruments, Inc.
- Current Assignee Address: US OH Cleveland
- Agency: Pearne & Gordon LLP
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R27/08

Abstract:
A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device; a buffer communicating with a common point between the sense impedance and the device; a current output stage; and a voltage output stage. When the circuit is controlling the current through the device, the voltage output stage forces the common point to a virtual ground and the current output stage forces a desired current through the device in response to a signal from the buffer. When the circuit is controlling the voltage across the device, the current output stage forces the common point to a virtual ground and the voltage output stage forces a desired voltage across the device in response to the signal from the buffer.
Information query