Invention Grant
- Patent Title: Circuit for compensation of leakage current-induced offset in a single-ended op-amp
- Patent Title (中): 单端运算放大器漏电流补偿补偿电路
-
Application No.: US12249370Application Date: 2008-10-10
-
Publication No.: US07907015B2Publication Date: 2011-03-15
- Inventor: Marcin Augustyniak , Bernhard Wicht
- Applicant: Marcin Augustyniak , Bernhard Wicht
- Applicant Address: DE Freising
- Assignee: Texas Instruments Deutschland GmbH
- Current Assignee: Texas Instruments Deutschland GmbH
- Current Assignee Address: DE Freising
- Agent William B. Kempler; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Priority: DE102007048454 20071010
- Main IPC: H03F1/14
- IPC: H03F1/14

Abstract:
An electronic device includes an operational amplifier, with the operational amplifier having an amplifier input stage coupled with a first output node to an amplifier output stage. A compensation capacitance is connected between an output node of the amplifier output stage and the first output node of the amplifier input stage, thereby operating as a compensator for stabilizing the operational amplifier. The compensation capacitance provides a parasitic diode drawing a first leakage current from the first output node of the amplifier input stage, a leakage current compensation circuit being coupled to the first output node of the amplifier input stage and coupled to a second output node of the amplifier input stage for drawing a first current from the first output node and a second current from the second output node. The leakage current compensation circuit is adapted such that the second current is greater than the first current by an amount corresponding to the first leakage current.
Public/Granted literature
- US20100148875A1 CIRCUIT FOR COMPENSATION OF LEAKAGE CURRENT-INDUCED OFFSET IN A SINGLE-ENDED OP-AMP Public/Granted day:2010-06-17
Information query
IPC分类: