Invention Grant
- Patent Title: Resonant tunneling diode oscillation device and inspection apparatus
- Patent Title (中): 谐振隧道二极管振荡装置及检测装置
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Application No.: US12189914Application Date: 2008-08-12
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Publication No.: US07907024B2Publication Date: 2011-03-15
- Inventor: Masahiro Asada , Toshihiko Ouchi , Ryota Sekiguchi
- Applicant: Masahiro Asada , Toshihiko Ouchi , Ryota Sekiguchi
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-213644 20070820
- Main IPC: H03K3/315
- IPC: H03K3/315 ; H01L29/88

Abstract:
An oscillation device has a resonant tunneling diode formed by interposing a gain medium including a first barrier layer, a quantum well layer and a second barrier layer between a first thickness adjusting layer and a second thickness adjusting layer. The oscillation device also has a switch for switching the polarity of a bias voltage being applied to the resonant tunneling diode. The first thickness adjusting layer and the second thickness adjusting layer have different thicknesses. Thus, a single oscillation device is driven to oscillate with different oscillation frequencies.
Public/Granted literature
- US20090051452A1 Oscillation device and inspection apparatus Public/Granted day:2009-02-26
Information query
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