Invention Grant
- Patent Title: Measurement of thin film porosity
- Patent Title (中): 测量薄膜孔隙率
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Application No.: US12193450Application Date: 2008-08-18
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Publication No.: US07907264B1Publication Date: 2011-03-15
- Inventor: Shankar Krishnan
- Applicant: Shankar Krishnan
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01N15/08 ; G01B11/00 ; G01B11/22 ; G01R31/26

Abstract:
A method of measuring a porosity of a film, by measuring a refractive index of the film in a first environment having a first relative humidity to produce a first refractive index measurement. The refractive index of the film is measured in a second environment having a second relative humidity, where the first relative humidity is different from the second relative humidity, to produce a second refractive index measurement. Multiple gases can be used to create the first and second environments. The first refractive index measurement and the second refractive index measurement are input into a model that correlates refractive index to film porosity, to output the porosity of the film.
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