Invention Grant
- Patent Title: Method and system for standardizing microscope instruments
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Application No.: US12139370Application Date: 2008-06-13
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Publication No.: US07907271B2Publication Date: 2011-03-15
- Inventor: Jason Christiansen , Robert Pinard , Maciej P. Zerkowski , Gregory R. Tedeschi
- Applicant: Jason Christiansen , Robert Pinard , Maciej P. Zerkowski , Gregory R. Tedeschi
- Applicant Address: US CT New Haven
- Assignee: HistoRx, Inc.
- Current Assignee: HistoRx, Inc.
- Current Assignee Address: US CT New Haven
- Agency: Foley & Lardner LLP
- Agent Gilberto M. Villacorta
- Main IPC: G01J1/00
- IPC: G01J1/00

Abstract:
Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
Public/Granted literature
- US20080309929A1 METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS Public/Granted day:2008-12-18
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