Invention Grant
- Patent Title: Shape measuring apparatus
- Patent Title (中): 形状测量仪
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Application No.: US12219285Application Date: 2008-07-18
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Publication No.: US07907288B2Publication Date: 2011-03-15
- Inventor: Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
- Applicant: Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2007-188070 20070719
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B11/02

Abstract:
A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
Public/Granted literature
- US20090021747A1 Shape measuring apparatus Public/Granted day:2009-01-22
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