Invention Grant
- Patent Title: Triple track test for side erase band width and side erase amplitude loss of a recording head
- Patent Title (中): 记录头侧擦除带宽和侧面擦除振幅损耗的三轨测试
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Application No.: US12183632Application Date: 2008-07-31
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Publication No.: US07907361B2Publication Date: 2011-03-15
- Inventor: Youping Deng , Mike X. Wang , Jing Zhang
- Applicant: Youping Deng , Mike X. Wang , Jing Zhang
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G11B27/36
- IPC: G11B27/36

Abstract:
A triple track test for determining respective erase band widths associated with a read/write head involves writing first and second data tracks in each direction and at a certain distance from an origin, and erasing a track having a center at the origin. Based on a triple track test profile (3T) corresponding to the three tracks, a first distance is measured in one direction from the origin to one of the modified data tracks and a first erase band width is computed based thereon. The other side erase band width is computable similarly. A side erase amplitude loss measurement procedure, for determining the amount of signal amplitude lost by an adjacent track due to the respective erase bands, involves constructing a side-erase profile based on a composite of the 3T profile and a full-track profile, from which respective amplitude losses are computed for the respective erase bands.
Public/Granted literature
- US20100027148A1 TRIPLE TRACK TEST FOR SIDE ERASE BAND WIDTH AND SIDE ERASE AMPLITUDE LOSS OF A RECORDING HEAD Public/Granted day:2010-02-04
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