Invention Grant
- Patent Title: Resistance variable memory device and method of writing data
- Patent Title (中): 电阻变量存储器件及数据写入方法
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Application No.: US12471526Application Date: 2009-05-26
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Publication No.: US07907437B2Publication Date: 2011-03-15
- Inventor: Jung Hyuk Lee , Kwangjin Lee , Daewon Ha , Gitae Jeong , Daehwan Kang
- Applicant: Jung Hyuk Lee , Kwangjin Lee , Daewon Ha , Gitae Jeong , Daehwan Kang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR2008-049221U 20080527
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A method of programming a resistance variable memory cell to a given logic state includes applying a first programming current to the memory cell, executing a verify read of the memory cell by sensing a logic state of the memory cell, and applying a second programming current to the memory cell when the sensed logic state is different than the given logic state, where the second programming current is greater than the first programming current.
Public/Granted literature
- US20090296458A1 RESISTANCE VARIABLE MEMORY DEVICE AND METHOD OF WRITING DATA Public/Granted day:2009-12-03
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