Invention Grant
- Patent Title: Non-volatile memory cell programming method
- Patent Title (中): 非易失性存储单元编程方法
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Application No.: US12081569Application Date: 2008-04-17
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Publication No.: US07907452B2Publication Date: 2011-03-15
- Inventor: Sang-jin Park , Kwang-soo Seol
- Applicant: Sang-jin Park , Kwang-soo Seol
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2007-0074648 20070725
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/06 ; G11C16/10 ; G11C16/12

Abstract:
A non-volatile memory cell programming method of programming 2-bit data in a memory cell having 4 threshold voltage distributions may include a first program operation of programming a first bit of the 2-bit data in the memory cell by applying a first programming voltage to the memory cell; a second program operation of programming a second bit of the 2-bit data in the memory cell by applying a second programming voltage to the memory cell; and a stabilization operation of applying a stabilization voltage having an electric field opposite in polarity to an electric field formed by the first and second programming voltages to the memory cell after one of the first and second program operations that corresponds to a higher one of the first and second programming voltages is performed.
Public/Granted literature
- US20090027961A1 Non-volatile memory cell programming method Public/Granted day:2009-01-29
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