Invention Grant
- Patent Title: System to estimate X-ray scatter
- Patent Title (中): 系统估计X射线散射
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Application No.: US12196106Application Date: 2008-08-21
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Publication No.: US07907697B2Publication Date: 2011-03-15
- Inventor: Jonathan S. Maltz
- Applicant: Jonathan S. Maltz
- Applicant Address: US PA Malvern
- Assignee: Siemens Medical Solutions USA, Inc.
- Current Assignee: Siemens Medical Solutions USA, Inc.
- Current Assignee Address: US PA Malvern
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
A system may include determination of a first scatter kernel based on a first energy, a material-equivalent radiological thickness and a first diameter, wherein the first scatter kernel is not a monotonically decreasing function of radial coordinate, determination of a second scatter kernel based on the first energy, the material-equivalent radiological thickness and a second diameter greater than the first diameter, determination of a third scatter kernel based on the first scatter kernel and the second scatter kernel, wherein the third scatter kernel is a monotonically decreasing function of radial coordinate, and estimation of scatter radiation within the projection image of the object based on the third scatter kernel.
Public/Granted literature
- US20100046696A1 SYSTEM TO ESTIMATE X-RAY SCATTER Public/Granted day:2010-02-25
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