Invention Grant
- Patent Title: Methods and apparatus for new useful metrics
- Patent Title (中): 新的有用指标的方法和设备
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Application No.: US11563121Application Date: 2006-11-24
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Publication No.: US07907757B2Publication Date: 2011-03-15
- Inventor: Thomas Louis Toth , Bernice Eland Hoppel , Rendon Clive Nelson , James George Colsher , Timothy Garvey Turkington , Lisa Mei-ling Ho
- Applicant: Thomas Louis Toth , Bernice Eland Hoppel , Rendon Clive Nelson , James George Colsher , Timothy Garvey Turkington , Lisa Mei-ling Ho
- Applicant Address: US NY Schenectady US NC Durham
- Assignee: General Electric Company,Duke University
- Current Assignee: General Electric Company,Duke University
- Current Assignee Address: US NY Schenectady US NC Durham
- Agency: ZPS Group, SC
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B6/00 ; G01N23/00 ; G21K1/12 ; H05G1/60
Abstract:
A computer readable medium is embedded with a program configured to receive or generate a PAI, and/or use the PAI in a diagnostic application.
Public/Granted literature
- US20080123920A1 Methods and Apparatus for New Useful Metrics Public/Granted day:2008-05-29
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