Invention Grant
- Patent Title: Circuit testing apparatus
- Patent Title (中): 电路检测仪
-
Application No.: US12130588Application Date: 2008-05-30
-
Publication No.: US07908108B2Publication Date: 2011-03-15
- Inventor: Cheng-Yung Teng , Li-Jieu Hsu
- Applicant: Cheng-Yung Teng , Li-Jieu Hsu
- Applicant Address: TW Taipei County
- Assignee: Princeton Technology Corporation
- Current Assignee: Princeton Technology Corporation
- Current Assignee Address: TW Taipei County
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: TW97205931U 20080408
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.
Public/Granted literature
- US20090254296A1 CIRCUIT TESTING APPARATUS Public/Granted day:2009-10-08
Information query
