Invention Grant
- Patent Title: Failure prediction circuit and method, and semiconductor integrated circuit
- Patent Title (中): 故障预测电路及方法,半导体集成电路
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Application No.: US12438576Application Date: 2007-08-09
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Publication No.: US07908538B2Publication Date: 2011-03-15
- Inventor: Masayuki Mizuno , Toru Nakura , Koichi Nose
- Applicant: Masayuki Mizuno , Toru Nakura , Koichi Nose
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2006-227942 20060824; JP2007-012876 20070123
- International Application: PCT/JP2007/065623 WO 20070809
- International Announcement: WO2008/023577 WO 20080228
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
Disclosed is a semiconductor integrated circuit including a first storage circuit and a second storage circuit that respectively store logic levels of an input to the delay circuit and an output of the delay circuit when a logic level of a clock line is changed, and a determination circuit that determines whether or not the results of the first storage circuit and the second storage circuit coincide or not. Even if a transistor or a wiring that constitutes the semiconductor integrated circuit has been degraded due to secular change or the like, a possibility of an anomaly or a failure in one of the operation circuits caused by the degradation can be predicted before the anomaly or the failure occurs.
Public/Granted literature
- US20100251046A1 FAILURE PREDICTION CIRCUIT AND METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT Public/Granted day:2010-09-30
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