Invention Grant
US07908538B2 Failure prediction circuit and method, and semiconductor integrated circuit 有权
故障预测电路及方法,半导体集成电路

  • Patent Title: Failure prediction circuit and method, and semiconductor integrated circuit
  • Patent Title (中): 故障预测电路及方法,半导体集成电路
  • Application No.: US12438576
    Application Date: 2007-08-09
  • Publication No.: US07908538B2
    Publication Date: 2011-03-15
  • Inventor: Masayuki MizunoToru NakuraKoichi Nose
  • Applicant: Masayuki MizunoToru NakuraKoichi Nose
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2006-227942 20060824; JP2007-012876 20070123
  • International Application: PCT/JP2007/065623 WO 20070809
  • International Announcement: WO2008/023577 WO 20080228
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Failure prediction circuit and method, and semiconductor integrated circuit
Abstract:
Disclosed is a semiconductor integrated circuit including a first storage circuit and a second storage circuit that respectively store logic levels of an input to the delay circuit and an output of the delay circuit when a logic level of a clock line is changed, and a determination circuit that determines whether or not the results of the first storage circuit and the second storage circuit coincide or not. Even if a transistor or a wiring that constitutes the semiconductor integrated circuit has been degraded due to secular change or the like, a possibility of an anomaly or a failure in one of the operation circuits caused by the degradation can be predicted before the anomaly or the failure occurs.
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