Invention Grant
US07908577B2 Apparatus and method for analyzing circuit specification description design
有权
用于分析电路规范描述设计的装置和方法
- Patent Title: Apparatus and method for analyzing circuit specification description design
- Patent Title (中): 用于分析电路规范描述设计的装置和方法
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Application No.: US12169845Application Date: 2008-07-09
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Publication No.: US07908577B2Publication Date: 2011-03-15
- Inventor: Takehiko Tsuchiya
- Applicant: Takehiko Tsuchiya
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2007-224591 20070830
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50

Abstract:
An apparatus for analyzing circuit specification description design has a circuit specification description inputting section that analyzes and obtains information of a related signal, information of the maximum number of cycles in the related signal, and a definite value in a site defined in the circuit specification description for the related signal contained in a circuit specification description, a data base generating section that generates signal variation data indicating time-series signal variation, wherein a definitive value is set in the site defined in the circuit specification description and a predetermined flag is set in a site where the value is not defined in the signal variation data, and a waveform diagram data outputting section that outputs waveform diagram data for displaying the time-series signal variation in a form of a waveform diagram on the basis of the definite value and the predetermined flag set in the data.
Public/Granted literature
- US20090064059A1 APPARATUS AND METHOD FOR ANALYZING CIRCUIT SPECIFICATION DESCRIPTION DESIGN Public/Granted day:2009-03-05
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