Invention Grant
- Patent Title: Method of evaluating the quality of a lapping plate
- Patent Title (中): 评估研磨盘质量的方法
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Application No.: US11289930Application Date: 2005-11-30
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Publication No.: US07914362B2Publication Date: 2011-03-29
- Inventor: Richard Dale Bunch , Linden James Crawforth , Eduardo Padilla , Xiao Z. Wu
- Applicant: Richard Dale Bunch , Linden James Crawforth , Eduardo Padilla , Xiao Z. Wu
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: B24B51/00
- IPC: B24B51/00
Abstract:
Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, information that indicates the quality of a lapping plate is received while the lapping plate is being used to lap a slider, and the information is used to evaluate the quality of the lapping plate while the lapping plate is being used to lap the slider.
Public/Granted literature
- US20070123150A1 Method of evaluating the quality of a lapping plate Public/Granted day:2007-05-31
Information query
