Invention Grant
- Patent Title: Semiconductor device with MISFET
- Patent Title (中): 具有MISFET的半导体器件
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Application No.: US12390840Application Date: 2009-02-23
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Publication No.: US07915688B2Publication Date: 2011-03-29
- Inventor: Amane Oishi
- Applicant: Amane Oishi
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2005-327583 20051111
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
A semiconductor device includes a substrate, a semiconductor region provided in the substrate, a group of transistors including a plurality of MIS transistors and provided in the semiconductor region, the MIS transistors including a plurality of gate electrodes which extend in a first direction and are provided on the semiconductor region via gate insulation films, an insulation film provided on the group of transistors, and a first contact layer and a second contact layer extending in the first direction and provided on the semiconductor region at opposite sides of the group of transistors.
Public/Granted literature
- US20090159979A1 SEMICONDUCTOR DEVICE WITH MISFET Public/Granted day:2009-06-25
Information query
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