Invention Grant
- Patent Title: Delay locked loop circuit and operational method thereof
- Patent Title (中): 延迟锁定环路电路及其操作方法
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Application No.: US12427028Application Date: 2009-04-21
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Publication No.: US07915934B2Publication Date: 2011-03-29
- Inventor: Young-Jun Ku
- Applicant: Young-Jun Ku
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2008-0134939 20081226
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A delay locked loop circuit includes a clock buffering block to generate first and second internal clocks corresponding to first and second edges of a source clock in response to a clock buffering control signal, respectively, wherein generation of the second internal clock is controlled by a duty correcting operation terminating signal and a delay locking signal, a delay locking block to compare phases of the first and second internal clocks with those of first and second feedback clocks, respectively, to enable the delay locking signal according to a delay locking and delay the first and second internal clocks as many as times corresponding to the comparison results, respectively, thereby outputting first and second delay locking clocks, a duty correcting block to mix phases of the first and second delay locking clocks, and a first signal generating block to generate the duty correcting operation terminating signal.
Public/Granted literature
- US20100164566A1 DELAY LOCKED LOOP CIRCUIT AND OPERATIONAL METHOD THEREOF Public/Granted day:2010-07-01
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