Invention Grant
- Patent Title: Method and circuitry for self testing of connectivity of touch screen panel
- Patent Title (中): 触摸屏面板连接自检的方法和电路
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Application No.: US11646778Application Date: 2006-12-28
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Publication No.: US07916127B2Publication Date: 2011-03-29
- Inventor: Ing-Yih Wang
- Applicant: Ing-Yih Wang
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John J. Patti; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G06F3/045
- IPC: G06F3/045

Abstract:
A touch screen digitizing system includes a first resistive screen and a touch screen controller including an ADC and self-test circuitry having a driver switch coupled between a reference voltage and a first terminal of the first resistive screen, and a first test switch coupled between ground and a conductor connected to generate a first test voltage on the conductor indicative of connection resistance between the first resistive screen and the touch screen controller. Another test switch couples the test voltage to an input of the ADC. An output of the ADC is compared with a reference to determine whether the connection resistance is excessive. Connection resistance between a second resistive screen and the touch screen controller is measured similarly. Similar self-test circuitry operates to detect a short circuit between the first resistive screen and the second resistive screen.
Public/Granted literature
- US20070200831A1 Method and circuitry for self testing of connectivity of touch screen panel Public/Granted day:2007-08-30
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