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US07916303B2 Non-uniform sampling to extend dynamic range of interferometric sensors 有权
非均匀采样来扩展干涉测量传感器的动态范围

Non-uniform sampling to extend dynamic range of interferometric sensors
Abstract:
Methods and apparatus for interrogating optical sensors with high slew rates using non-uniform sampling are provided. The transmission of optical signals in a non-uniform pattern is employed to allow for demodulation of fringe rates exceeding the commonly understood Nyquist frequency limit given as one half of the mean sampling frequency. By monitoring the time dependent fringe frequency and assuming that the fringe frequency has a limited bandwidth, only a limited bandwidth smaller than the Nyquist bandwidth around the instantaneous fringe frequency needs to be reconstructed at any time.
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