Invention Grant
US07916303B2 Non-uniform sampling to extend dynamic range of interferometric sensors
有权
非均匀采样来扩展干涉测量传感器的动态范围
- Patent Title: Non-uniform sampling to extend dynamic range of interferometric sensors
- Patent Title (中): 非均匀采样来扩展干涉测量传感器的动态范围
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Application No.: US11939366Application Date: 2007-11-13
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Publication No.: US07916303B2Publication Date: 2011-03-29
- Inventor: Erlend Ronnekleiv , Ole Henrik Waagaard
- Applicant: Erlend Ronnekleiv , Ole Henrik Waagaard
- Applicant Address: NO Trondheim
- Assignee: Optoplan AS
- Current Assignee: Optoplan AS
- Current Assignee Address: NO Trondheim
- Agency: Patterson & Sheridan, L.L.P.
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
Methods and apparatus for interrogating optical sensors with high slew rates using non-uniform sampling are provided. The transmission of optical signals in a non-uniform pattern is employed to allow for demodulation of fringe rates exceeding the commonly understood Nyquist frequency limit given as one half of the mean sampling frequency. By monitoring the time dependent fringe frequency and assuming that the fringe frequency has a limited bandwidth, only a limited bandwidth smaller than the Nyquist bandwidth around the instantaneous fringe frequency needs to be reconstructed at any time.
Public/Granted literature
- US20090122319A1 NON-UNIFORM SAMPLING TO EXTEND DYNAMIC RANGE OF INTERFEROMETRIC SENSORS Public/Granted day:2009-05-14
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