Invention Grant
US07916377B2 Integrated control system for laser and Mach-Zehnder interferometer
有权
激光和马赫 - 策德尔干涉仪的集成控制系统
- Patent Title: Integrated control system for laser and Mach-Zehnder interferometer
- Patent Title (中): 激光和马赫 - 策德尔干涉仪的集成控制系统
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Application No.: US12611584Application Date: 2009-11-03
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Publication No.: US07916377B2Publication Date: 2011-03-29
- Inventor: Jeremy Witzens , Behnam Analui , Sina Mirsaidi , Thiruvikraman Sadagopan , Brian Welch , Adithyaram Narasimha
- Applicant: Jeremy Witzens , Behnam Analui , Sina Mirsaidi , Thiruvikraman Sadagopan , Brian Welch , Adithyaram Narasimha
- Applicant Address: US CA Carlsbad
- Assignee: Luxtera, Inc.
- Current Assignee: Luxtera, Inc.
- Current Assignee Address: US CA Carlsbad
- Agency: McAndrews, Held & Malloy, Ltd.
- Main IPC: G02B26/00
- IPC: G02B26/00 ; G02B26/08 ; G02B6/10

Abstract:
An integrated control system for a laser and Mach-Zehnder interferometer are disclosed and may include configuring a bias point for low-speed control of an optical modulator utilizing control circuitry integrated on the same CMOS die. The optical modulator may be differentially monitored. A laser source for the modulator may be controlled utilizing monitor photodiodes via optical taps on outputs of the modulator, or utilizing a monitor photodiode on one output port of the modulator, which may comprise a Mach-Zehnder interferometer. An error signal may be generated by subtracting monitor photodiode signals from optical taps on output ports of the modulator. The bias point of the modulator may be adjusted by minimizing the error signal. Calibration time of the bias point may be reduced utilizing electronic data inversion. An output of the modulator may comprise a Y-junction and a single monitor photodiode may measure both branches of the modulator.
Public/Granted literature
- US20100128336A1 INTEGRATED CONTROL SYSTEM FOR LASER AND MACH-ZEHNDER INTERFEROMETER Public/Granted day:2010-05-27
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