Invention Grant
US07917819B2 JTAG test architecture for multi-chip pack 有权
用于多芯片封装的JTAG测试架构

  • Patent Title: JTAG test architecture for multi-chip pack
  • Patent Title (中): 用于多芯片封装的JTAG测试架构
  • Application No.: US10585607
    Application Date: 2005-01-05
  • Publication No.: US07917819B2
    Publication Date: 2011-03-29
  • Inventor: Jacky TalayssatSake Buwalda
  • Applicant: Jacky TalayssatSake Buwalda
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP04300016 20040113
  • International Application: PCT/IB2005/000072 WO 20050105
  • International Announcement: WO2005/069025 WO 20050728
  • Main IPC: G01R31/28
  • IPC: G01R31/28
JTAG test architecture for multi-chip pack
Abstract:
A test-communication path is provided between chips in a multi-chip package. Externally-accessible JTAG input and output pins are provided to a first chip in the multi-chip package, and this first chip is configured to allow signals received on these JTAG pins to be routed to other chips in the multi-chip package. Control signals provided to the first chip control the routing of the JTAG signals to each chip.
Public/Granted literature
Information query
Patent Agency Ranking
0/0