Invention Grant
- Patent Title: JTAG test architecture for multi-chip pack
- Patent Title (中): 用于多芯片封装的JTAG测试架构
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Application No.: US10585607Application Date: 2005-01-05
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Publication No.: US07917819B2Publication Date: 2011-03-29
- Inventor: Jacky Talayssat , Sake Buwalda
- Applicant: Jacky Talayssat , Sake Buwalda
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP04300016 20040113
- International Application: PCT/IB2005/000072 WO 20050105
- International Announcement: WO2005/069025 WO 20050728
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A test-communication path is provided between chips in a multi-chip package. Externally-accessible JTAG input and output pins are provided to a first chip in the multi-chip package, and this first chip is configured to allow signals received on these JTAG pins to be routed to other chips in the multi-chip package. Control signals provided to the first chip control the routing of the JTAG signals to each chip.
Public/Granted literature
- US20080288839A1 Jtag Test Architecture For Multi-Chip Pack Public/Granted day:2008-11-20
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