Invention Grant
- Patent Title: Sample analyzer and its components
- Patent Title (中): 样品分析仪及其组件
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Application No.: US11925478Application Date: 2007-10-26
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Publication No.: US07919044B2Publication Date: 2011-04-05
- Inventor: Toshikatsu Fukuju , Takaaki Nagai , Shuhei Kaneko , Hidenari Takaoka , Noriyoshi Yoshida , Takashi Yoshida
- Applicant: Toshikatsu Fukuju , Takaaki Nagai , Shuhei Kaneko , Hidenari Takaoka , Noriyoshi Yoshida , Takashi Yoshida
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2002-334243 20021118; JP2002-334251 20021118; JP2002-334272 20021118; JP2002-334286 20021118; JP2002-334293 20021118; JP2003-193715 20030708
- Main IPC: G01N33/00
- IPC: G01N33/00

Abstract:
A sample analyzer includes a liquid aspirator to be stuck into the closed container for aspirating a sample from a closed container; a preparing section for preparing an analysis sample using the aspirated sample; and an analyzing section for analyzing the prepared analysis sample; the liquid aspirator including an elongated pipe, the pipe having a liquid flow path extending therein and a plurality of communicating sections provided in an outer surface thereof, at least one of the communicating sections communicating between an inside and an outside of the container when the pipe is stuck into the container.
Public/Granted literature
- US20080063568A1 SAMPLE ANALYZER AND ITS COMPONENTS Public/Granted day:2008-03-13
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